Evolution of Reliability Assessment in Pcb Assemblies

Very low failure rates, down to 10 FIT are now currently expected by electronic system manufacturers. In the same time, severe conditions of utilisation are common in most of industrial and commercial applications, like automotive sector for example. In order to assess this reliability “challenge”, process control, design and technological solutions have to be optimised to guarantee almost no defect during the operating life time. Reliability testing strategy must also strongly evolve from the classical accelerated ageing statistical median life testing to the use of more sophisticated degradation laws, based on physics of failure, and in many cases computer assisted.